Xing Di, Benjamin S. Riggan, Shuowen Hu, Nathaniel J. Short, Vishal M. Patel. Polarimetric Thermal to Visible Face Verification via Self-Attention Guided Synthesis. In 2019 International Conference on Biometrics, ICB 2019, Crete, Greece, June 4-7, 2019. pages 1-8, IEEE, 2019. [doi]
@inproceedings{DiRHSP19,
title = {Polarimetric Thermal to Visible Face Verification via Self-Attention Guided Synthesis},
author = {Xing Di and Benjamin S. Riggan and Shuowen Hu and Nathaniel J. Short and Vishal M. Patel},
year = {2019},
doi = {10.1109/ICB45273.2019.8987329},
url = {https://doi.org/10.1109/ICB45273.2019.8987329},
researchr = {https://researchr.org/publication/DiRHSP19},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2019 International Conference on Biometrics, ICB 2019, Crete, Greece, June 4-7, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3640-0},
}