Yejia Di, Liang Shi, Congming Gao, Qiao Li, Kaijie Wu 0001, Chun Jason Xue. Loss is Gain: Shortening Data for Lifetime Improvement on Low-Cost ECC Enabled Consumer-Level Flash Memory. In Deming Chen, Houman Homayoun, Baris Taskin, editors, Proceedings of the 2018 on Great Lakes Symposium on VLSI, GLSVLSI 2018, Chicago, IL, USA, May 23-25, 2018. pages 225-230, ACM, 2018. [doi]