Christian Charles Dias, Clarice Sofia H. Soares, Larissa T. Da Silva, Cleuves de Carvalho, João Paulo M. Matos, Yago Luiz M. Silva, Danyllo Albuquerque, Danilo F. S. Santos. On-Target Test Automation for an Embedded Digital Signal Processing Device. In IEEE International Conference on Consumer Electronics, ICCE 2022, Las Vegas, NV, USA, January 7-9, 2022. pages 1-2, IEEE, 2022. [doi]
Abstract is missing.