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Quality of Electronic Design: From Architectural Level to Test Coverage

Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira. Quality of Electronic Design: From Architectural Level to Test Coverage. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 197, IEEE Computer Society, 2000. [doi]

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Octávio Páscoa Dias

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Jorge Semião

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Marcelino B. Santos

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Isabel C. Teixeira

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João Paulo Teixeira

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