Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira. Quality of Electronic Design: From Architectural Level to Test Coverage. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 197, IEEE Computer Society, 2000. [doi]
@inproceedings{DiasSSTT00,
title = {Quality of Electronic Design: From Architectural Level to Test Coverage},
author = {Octávio Páscoa Dias and Jorge Semião and Marcelino B. Santos and Isabel C. Teixeira and João Paulo Teixeira},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/isqed/2000/0525/00/05250197abs.htm},
tags = {test coverage, architecture, testing, C++, design, coverage},
researchr = {https://researchr.org/publication/DiasSSTT00},
cites = {0},
citedby = {0},
pages = {197},
booktitle = {1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0525-2},
}