Juan Carlos Fernandez Diaz, Jasmeet Judge, K. Clint Slatton, Ramesh L. Shrestha, William E. Carter, David Bloomquist. Characterization of full surface roughness in agricultural soils using groundbased LiDAR. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 4442-4445, IEEE, 2010. [doi]
Abstract is missing.