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Exploiting Image Collections for Recovering Photometric Properties

Mauricio Díaz, Peter F. Sturm. Exploiting Image Collections for Recovering Photometric Properties. In Pedro Real, Daniel Díaz-Pernil, Helena Molina-Abril, Ainhoa Berciano, Walter G. Kropatsch, editors, Computer Analysis of Images and Patterns - 14th International Conference, CAIP 2011, Seville, Spain, August 29-31, 2011, Proceedings, Part II. Volume 6855 of Lecture Notes in Computer Science, pages 253-260, Springer, 2011. [doi]

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Mauricio Díaz

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Peter F. Sturm

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