Mauricio Díaz, Peter F. Sturm. Exploiting Image Collections for Recovering Photometric Properties. In Pedro Real, Daniel Díaz-Pernil, Helena Molina-Abril, Ainhoa Berciano, Walter G. Kropatsch, editors, Computer Analysis of Images and Patterns - 14th International Conference, CAIP 2011, Seville, Spain, August 29-31, 2011, Proceedings, Part II. Volume 6855 of Lecture Notes in Computer Science, pages 253-260, Springer, 2011. [doi]
@inproceedings{DiazS11,
title = {Exploiting Image Collections for Recovering Photometric Properties},
author = {Mauricio Díaz and Peter F. Sturm},
year = {2011},
doi = {10.1007/978-3-642-23678-5_29},
url = {http://dx.doi.org/10.1007/978-3-642-23678-5_29},
researchr = {https://researchr.org/publication/DiazS11},
cites = {0},
citedby = {0},
pages = {253-260},
booktitle = {Computer Analysis of Images and Patterns - 14th International Conference, CAIP 2011, Seville, Spain, August 29-31, 2011, Proceedings, Part II},
editor = {Pedro Real and Daniel Díaz-Pernil and Helena Molina-Abril and Ainhoa Berciano and Walter G. Kropatsch},
volume = {6855},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-23677-8},
}