Process tolerant calibration circuit for PLL applications with BIST

Quentin Diduck, John Liobe, Sadeka Ali, Martin Margala. Process tolerant calibration circuit for PLL applications with BIST. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

@inproceedings{DiduckLAM06,
  title = {Process tolerant calibration circuit for PLL applications with BIST},
  author = {Quentin Diduck and John Liobe and Sadeka Ali and Martin Margala},
  year = {2006},
  doi = {10.1109/ISCAS.2006.1693125},
  url = {http://dx.doi.org/10.1109/ISCAS.2006.1693125},
  researchr = {https://researchr.org/publication/DiduckLAM06},
  cites = {0},
  citedby = {0},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece},
  publisher = {IEEE},
}