Process tolerant calibration circuit for PLL applications with BIST

Quentin Diduck, John Liobe, Sadeka Ali, Martin Margala. Process tolerant calibration circuit for PLL applications with BIST. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Abstract

Abstract is missing.