Thaer M. Dieb, Masaharu Yoshioka, Shinjiroh Hara. Automatic Information Extraction of Experiments from Nanodevices Development Papers. In IIAI International Conference on Advanced Applied Informatics, IIAI-AAI 2012, Fukuoka, Japan, September 20-22, 2012. pages 42-47, IEEE, 2012. [doi]
Abstract is missing.