Bart Dierickx, Benoit Dupont, Arnaud Defernez, Nayera Ahmed. -rms accurate threshold. In IEEE International Solid-State Circuits Conference, ISSCC 2011, Digest of Technical Papers, San Francisco, CA, USA, 20-24 February, 2011. pages 114-116, IEEE, 2011. [doi]
@inproceedings{DierickxDDA11,
title = {-rms accurate threshold},
author = {Bart Dierickx and Benoit Dupont and Arnaud Defernez and Nayera Ahmed},
year = {2011},
doi = {10.1109/ISSCC.2011.5746243},
url = {http://dx.doi.org/10.1109/ISSCC.2011.5746243},
researchr = {https://researchr.org/publication/DierickxDDA11},
cites = {0},
citedby = {0},
pages = {114-116},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2011, Digest of Technical Papers, San Francisco, CA, USA, 20-24 February, 2011},
publisher = {IEEE},
isbn = {978-1-61284-303-2},
}