Juan M. Díez, Juan Carlos López. Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 645-649, IEEE Computer Society, 2000. [doi]
@inproceedings{DiezL00,
title = {Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion},
author = {Juan M. Díez and Juan Carlos López},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370645abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/DiezL00},
cites = {0},
citedby = {0},
pages = {645-649},
booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-0537-6},
}