Onset Detection through Maximal Redundancy Detection

Gert Van Dijck, Marc M. Van Hulle. Onset Detection through Maximal Redundancy Detection. In 18th International Conference on Pattern Recognition (ICPR 2006), 20-24 August 2006, Hong Kong, China. pages 945-949, IEEE Computer Society, 2006. [doi]

Authors

Gert Van Dijck

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Marc M. Van Hulle

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