Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard. Reducing Power Dissipation in SRAM during Test. J. Low Power Electronics, 2(2):271-280, 2006. [doi]
@article{DililloRAG06:0,
title = {Reducing Power Dissipation in SRAM during Test},
author = {Luigi Dilillo and Paul M. Rosinger and Bashir M. Al-Hashimi and Patrick Girard},
year = {2006},
doi = {10.1166/jolpe.2006.062},
url = {http://dx.doi.org/10.1166/jolpe.2006.062},
tags = {testing},
researchr = {https://researchr.org/publication/DililloRAG06%3A0},
cites = {0},
citedby = {0},
journal = {J. Low Power Electronics},
volume = {2},
number = {2},
pages = {271-280},
}