Wenzhe Ding, Xiang Bai, Qingwei Wang, Fang Long, Hailin Li, Zhengrong Wu, Jian Liu, Huisheng Yao, Hong Yang. A truncated test scheme design method for success-failure in-orbit tests. Rel. Eng. & Sys. Safety, 243:109782, March 2024. [doi]
@article{DingBWLLWLYY24,
title = {A truncated test scheme design method for success-failure in-orbit tests},
author = {Wenzhe Ding and Xiang Bai and Qingwei Wang and Fang Long and Hailin Li and Zhengrong Wu and Jian Liu and Huisheng Yao and Hong Yang},
year = {2024},
month = {March},
doi = {10.1016/j.ress.2023.109782},
url = {https://doi.org/10.1016/j.ress.2023.109782},
researchr = {https://researchr.org/publication/DingBWLLWLYY24},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {243},
pages = {109782},
}