Wenzhe Ding, Xiang Bai, Qingwei Wang, Fang Long, Hailin Li, Zhengrong Wu, Jian Liu, Huisheng Yao, Hong Yang. A truncated test scheme design method for success-failure in-orbit tests. Rel. Eng. & Sys. Safety, 243:109782, March 2024. [doi]
Abstract is missing.