External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model

Lili Ding, Wei Chen, Hongxia Guo, Tan Wang, Rongmei Chen, Yinhong Luo, Fengqi Zhang, Xiaoyu Pan. Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. Microelectronics Reliability, 81:337-341, 2018. [doi]

Authors

Lili Ding

This author has not been identified. Look up 'Lili Ding' in Google

Wei Chen

This author has not been identified. Look up 'Wei Chen' in Google

Hongxia Guo

This author has not been identified. Look up 'Hongxia Guo' in Google

Tan Wang

This author has not been identified. Look up 'Tan Wang' in Google

Rongmei Chen

This author has not been identified. Look up 'Rongmei Chen' in Google

Yinhong Luo

This author has not been identified. Look up 'Yinhong Luo' in Google

Fengqi Zhang

This author has not been identified. Look up 'Fengqi Zhang' in Google

Xiaoyu Pan

This author has not been identified. Look up 'Xiaoyu Pan' in Google
runs on