Lili Ding, Wei Chen, Hongxia Guo, Tan Wang, Rongmei Chen, Yinhong Luo, Fengqi Zhang, Xiaoyu Pan. Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. Microelectronics Reliability, 81:337-341, 2018. [doi]
@article{DingCGWCLZP18,
title = {Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model},
author = {Lili Ding and Wei Chen and Hongxia Guo and Tan Wang and Rongmei Chen and Yinhong Luo and Fengqi Zhang and Xiaoyu Pan},
year = {2018},
doi = {10.1016/j.microrel.2017.11.001},
url = {https://doi.org/10.1016/j.microrel.2017.11.001},
researchr = {https://researchr.org/publication/DingCGWCLZP18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {81},
pages = {337-341},
}