Xian Ding, Lili Fu, Tao Sun, Jun Du, Ling Yi, Bing Ma. An automated method for detecting security chip faults. In 6th IEEE International Conference on Information Systems and Computer Aided Educatio, ICISCAE 2023, Dalian, China, September 23-25, 2023. pages 97-100, IEEE, 2023. [doi]
Abstract is missing.