Cross-layer refresh mitigation for efficient and reliable DRAM systems: A comparative study

Xiaoan Ding, Xi Liang, Yanjing Li. Cross-layer refresh mitigation for efficient and reliable DRAM systems: A comparative study. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

Authors

Xiaoan Ding

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Xi Liang

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Yanjing Li

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