Yaohui Ding, Arun Ross. An ensemble of one-class SVMs for fingerprint spoof detection across different fabrication materials. In IEEE International Workshop on Information Forensics and Security, WIFS 2016, Abu Dhabi, United Arab Emirates, December 4-7, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{DingR16-1, title = {An ensemble of one-class SVMs for fingerprint spoof detection across different fabrication materials}, author = {Yaohui Ding and Arun Ross}, year = {2016}, doi = {10.1109/WIFS.2016.7823572}, url = {http://dx.doi.org/10.1109/WIFS.2016.7823572}, researchr = {https://researchr.org/publication/DingR16-1}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE International Workshop on Information Forensics and Security, WIFS 2016, Abu Dhabi, United Arab Emirates, December 4-7, 2016}, publisher = {IEEE}, isbn = {978-1-5090-1138-4}, }