An ensemble of one-class SVMs for fingerprint spoof detection across different fabrication materials

Yaohui Ding, Arun Ross. An ensemble of one-class SVMs for fingerprint spoof detection across different fabrication materials. In IEEE International Workshop on Information Forensics and Security, WIFS 2016, Abu Dhabi, United Arab Emirates, December 4-7, 2016. pages 1-6, IEEE, 2016. [doi]

Abstract

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