Investigation of SRAM using BTI-aware statistical compact models

Jie Ding, Dave Reid, Campbell Millar, Asen Asenov. Investigation of SRAM using BTI-aware statistical compact models. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 186-189, IEEE, 2013. [doi]

Abstract

Abstract is missing.