Jiwen Ding, XiusHuang Yi, Jun Guo. Research and practice on the whole life cycle test process model. In Yihai Chen, editor, 17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2016, Shanghai, China, May 30 - June 1, 2016. pages 553-556, IEEE Computer Society, 2016. [doi]
Abstract is missing.