RR: A Fault Model for Efficient TEE Replication

Baltasar Dinis, Peter Druschel, Rodrigo Rodrigues 0001. RR: A Fault Model for Efficient TEE Replication. In 30th Annual Network and Distributed System Security Symposium, NDSS 2023, San Diego, California, USA, February 27 - March 3, 2023. The Internet Society, 2023. [doi]

Abstract

Abstract is missing.