Apiwat Ditthapron, Emmanuel O. Agu, Peder C. Pedersen, Clifford Lindsay, Bengisu Tulu, Diane M. Strong. On Rejecting Low Quality Images to Improve Deep Smartphone Wound Assessment. In International Conference on Machine Learning and Applications, ICMLA 2023, Jacksonville, FL, USA, December 15-17, 2023. pages 2113-2118, IEEE, 2023. [doi]
Abstract is missing.