Abhisek Dixit, Anirban Bandhyopadhyay, Nadine Collaert, Kristin De Meyer, Malgorzata Jurczak. Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack. In VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009. pages 253-258, IEEE, 2009. [doi]
@inproceedings{DixitBCMJ09,
title = {Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack},
author = {Abhisek Dixit and Anirban Bandhyopadhyay and Nadine Collaert and Kristin De Meyer and Malgorzata Jurczak},
year = {2009},
doi = {10.1109/VLSI.Design.2009.80},
url = {http://dx.doi.org/10.1109/VLSI.Design.2009.80},
tags = {analysis},
researchr = {https://researchr.org/publication/DixitBCMJ09},
cites = {0},
citedby = {0},
pages = {253-258},
booktitle = {VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009},
publisher = {IEEE},
isbn = {978-0-7695-3506-7},
}