Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj. Cross Layer Error Exploitation for Aggressive Voltage Scaling. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 192-197, IEEE Computer Society, 2007. [doi]
@inproceedings{DjahromiEKK07,
title = {Cross Layer Error Exploitation for Aggressive Voltage Scaling},
author = {Amin Khajeh Djahromi and Ahmed M. Eltawil and Fadi J. Kurdahi and Rouwaida Kanj},
year = {2007},
doi = {10.1109/ISQED.2007.53},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.53},
researchr = {https://researchr.org/publication/DjahromiEKK07},
cites = {0},
citedby = {0},
pages = {192-197},
booktitle = {8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2795-6},
}