Cross Layer Error Exploitation for Aggressive Voltage Scaling

Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj. Cross Layer Error Exploitation for Aggressive Voltage Scaling. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 192-197, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.