Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)

Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet. Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS). In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 53, IEEE Computer Society, 2003. [doi]

@inproceedings{DjajaCCA03,
  title = {Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)},
  author = {Sunjaya Djaja and Glenn H. Chapman and Desmond Y. H. Cheung and Yves Audet},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420053abs.htm},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/DjajaCCA03},
  cites = {0},
  citedby = {0},
  pages = {53},
  booktitle = {18th  IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2042-1},
}