A tunable, robust pseudo-resistor with enhanced linearity for scanning ion-conductance microscopy - researchr publication authors

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Denis Djekic, Maurits Ortmanns, Georg Fantner, Jens Anders. A tunable, robust pseudo-resistor with enhanced linearity for scanning ion-conductance microscopy. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 842-845, IEEE, 2016. [doi]

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