New Self-dual Circuits for Error Detection and Testing

Alexej Dmitriev, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov. New Self-dual Circuits for Error Detection and Testing. VLSI Design, 2000(1):1-21, 2000. [doi]

Abstract

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