Roland Dobai, Elena Gramatová. Test pattern generation for the combinational representation of asynchronous circuits. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 323-328, IEEE, 2010. [doi]
@inproceedings{DobaiG10-0,
title = {Test pattern generation for the combinational representation of asynchronous circuits},
author = {Roland Dobai and Elena Gramatová},
year = {2010},
doi = {10.1109/DDECS.2010.5491759},
url = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2010.5491759},
researchr = {https://researchr.org/publication/DobaiG10-0},
cites = {0},
citedby = {0},
pages = {323-328},
booktitle = {13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010},
editor = {Elena Gramatová and Zdenek Kotásek and Andreas Steininger and Heinrich Theodor Vierhaus and Horst Zimmermann},
publisher = {IEEE},
isbn = {978-1-4244-6612-2},
}