Roland Dobai, Elena Gramatová. A novel automatic test pattern generator for asynchronous sequential digital circuits. Microelectronics Journal, 42(3):501-508, 2011. [doi]
@article{DobaiG11,
title = {A novel automatic test pattern generator for asynchronous sequential digital circuits},
author = {Roland Dobai and Elena Gramatová},
year = {2011},
doi = {10.1016/j.mejo.2010.10.013},
url = {http://dx.doi.org/10.1016/j.mejo.2010.10.013},
tags = {testing},
researchr = {https://researchr.org/publication/DobaiG11},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {42},
number = {3},
pages = {501-508},
}