Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen. Analog fault coverage improvement using final-test dynamic part average testing. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-9, IEEE, 2016. [doi]
Abstract is missing.