Petr Dobrovolný, Miguel Miranda, Paul Zuber. Variability Aware Sub-Wavelength Lithography Characterization for Robust SRAM Design. In Wolfgang Karl, Dimitrios Soudris, editors, ARCS 2011 - 24th International Conference on Architecture of Computing Systems 2011, Workshop Proceedings, February 22-23, 2011, Como, Italy. VDE-Verlag, 2011. [doi]
@inproceedings{DobrovolnyMZ11,
title = {Variability Aware Sub-Wavelength Lithography Characterization for Robust SRAM Design},
author = {Petr Dobrovolný and Miguel Miranda and Paul Zuber},
year = {2011},
url = {http://www.vde-verlag.de/proceedings-de/563333028.html},
researchr = {https://researchr.org/publication/DobrovolnyMZ11},
cites = {0},
citedby = {0},
booktitle = {ARCS 2011 - 24th International Conference on Architecture of Computing Systems 2011, Workshop Proceedings, February 22-23, 2011, Como, Italy},
editor = {Wolfgang Karl and Dimitrios Soudris},
publisher = {VDE-Verlag},
isbn = {978-3-8007-3333-0},
}