Petr Dobrovolný, Miguel Miranda, Paul Zuber. Variability Aware Sub-Wavelength Lithography Characterization for Robust SRAM Design. In Wolfgang Karl, Dimitrios Soudris, editors, ARCS 2011 - 24th International Conference on Architecture of Computing Systems 2011, Workshop Proceedings, February 22-23, 2011, Como, Italy. VDE-Verlag, 2011. [doi]
Abstract is missing.