Norman Dodel, Stefan Keil, Andreas Wiemhofer, Malte Kortstock, Philipp Scholz, Uwe Kerst, Roland Thewes. A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips. In Wolfgang Pribyl, Franz Dielacher, Gernot Hueber, editors, st European Solid-State Circuits Conference, Graz, Austria, September 14-18, 2015. pages 412-415, IEEE, 2015. [doi]
@inproceedings{DodelKWKSKT15,
title = {A BIST structure for the evaluation of the MOSFET gate dielectric interface state density in post-processed CMOS chips},
author = {Norman Dodel and Stefan Keil and Andreas Wiemhofer and Malte Kortstock and Philipp Scholz and Uwe Kerst and Roland Thewes},
year = {2015},
doi = {10.1109/ESSCIRC.2015.7313915},
url = {http://dx.doi.org/10.1109/ESSCIRC.2015.7313915},
researchr = {https://researchr.org/publication/DodelKWKSKT15},
cites = {0},
citedby = {0},
pages = {412-415},
booktitle = {st European Solid-State Circuits Conference, Graz, Austria, September 14-18, 2015},
editor = {Wolfgang Pribyl and Franz Dielacher and Gernot Hueber},
publisher = {IEEE},
isbn = {978-1-4673-7472-9},
}