Lie detection using extreme learning machine: A concealed information test based on short-time Fourier transform and binary bat optimization using a novel fitness function - researchr publication authors

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Shubham Dodia, Damodar Reddy Edla, Annushree Bablani, Ramalingaswamy Cheruku. Lie detection using extreme learning machine: A concealed information test based on short-time Fourier transform and binary bat optimization using a novel fitness function. Computational Intelligence, 36(2):637-658, 2020. [doi]

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