Lie detection using extreme learning machine: A concealed information test based on short-time Fourier transform and binary bat optimization using a novel fitness function

Shubham Dodia, Damodar Reddy Edla, Annushree Bablani, Ramalingaswamy Cheruku. Lie detection using extreme learning machine: A concealed information test based on short-time Fourier transform and binary bat optimization using a novel fitness function. Computational Intelligence, 36(2):637-658, 2020. [doi]

Abstract

Abstract is missing.