Logo recognition using geometric invariants

David S. Doermann, Ehud Rivlin, Isaac Weiss. Logo recognition using geometric invariants. In 2nd International Conference Document Analysis and Recognition, ICDAR '93, October 20-22, 1993, Tsukuba City, Japan. pages 894-897, IEEE, 1993. [doi]

Authors

David S. Doermann

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Ehud Rivlin

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Isaac Weiss

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