David S. Doermann, Ehud Rivlin, Isaac Weiss. Logo recognition using geometric invariants. In 2nd International Conference Document Analysis and Recognition, ICDAR '93, October 20-22, 1993, Tsukuba City, Japan. pages 894-897, IEEE, 1993. [doi]
@inproceedings{DoermannRW93, title = {Logo recognition using geometric invariants}, author = {David S. Doermann and Ehud Rivlin and Isaac Weiss}, year = {1993}, doi = {10.1109/ICDAR.1993.395593}, url = {http://dx.doi.org/10.1109/ICDAR.1993.395593}, researchr = {https://researchr.org/publication/DoermannRW93}, cites = {0}, citedby = {0}, pages = {894-897}, booktitle = {2nd International Conference Document Analysis and Recognition, ICDAR '93, October 20-22, 1993, Tsukuba City, Japan}, publisher = {IEEE}, isbn = {0-8186-4960-7}, }