Bernard Doherty, Andrew Jelfs, Aveek Dasgupta, Patrick Holden. Defect Analysis in Large Scale Agile Development: Quality in the Agile Factory Model. In Jens Heidrich, Frank W. Vogelezang, editors, 2016 Joint Conference of the International Workshop on Software Measurement and the International Conference on Software Process and Product Measurement, IWSM-MENSURA 2016, Berlin, Germany, October 5-7, 2016. pages 180, IEEE Computer Society, 2016. [doi]
Abstract is missing.