Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns

Hideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki. Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. In ICCV. pages 575-582, 1995. [doi]

Abstract

Abstract is missing.