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Characterization of a Nanometer Displacement Gauge for the Dimensional Control of Large Optomechanical Structures

Alberto Donazzan, Giampiero Naletto, Jacopo Belfi, Davide Cuccato, Alain Jody Corso, Angela Di Virgilio, Antonello Ortolan, Maria Guglielmina Pelizzo. Characterization of a Nanometer Displacement Gauge for the Dimensional Control of Large Optomechanical Structures. IEEE T. Instrumentation and Measurement, 68(4):1165-1177, 2019. [doi]

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