Correntropy induced metric based common spatial patterns

Jiyao Dong, Badong Chen, Na Lu, Haixian Wang, Nanning Zheng 0001. Correntropy induced metric based common spatial patterns. In Naonori Ueda, Shinji Watanabe, Tomoko Matsui, Jen-Tzung Chien, Jan Larsen, editors, 27th IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2017, Tokyo, Japan, September 25-28, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

Abstract is missing.