Maximizing scan pin and bandwidth utilization with a scan routing fabric - researchr publication authors

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Yan Dong, Grady Giles, Guoliang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood. Maximizing scan pin and bandwidth utilization with a scan routing fabric. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

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