Terminating the Reliability Growth Test Under Small Sample Failure Dataset

Wenjie Dong 0003, Jinyan Guo, Lianyi Liu, Yingjie Yang. Terminating the Reliability Growth Test Under Small Sample Failure Dataset. IEEE Transactions on Reliability, 74(4):4832-4841, December 2025. [doi]

Authors

Wenjie Dong 0003

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Jinyan Guo

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Lianyi Liu

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Yingjie Yang

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