Wenjie Dong 0003, Jinyan Guo, Lianyi Liu, Yingjie Yang. Terminating the Reliability Growth Test Under Small Sample Failure Dataset. IEEE Transactions on Reliability, 74(4):4832-4841, December 2025. [doi]
@article{DongGLY25,
title = {Terminating the Reliability Growth Test Under Small Sample Failure Dataset},
author = {Wenjie Dong 0003 and Jinyan Guo and Lianyi Liu and Yingjie Yang},
year = {2025},
month = {December},
doi = {10.1109/TR.2025.3623110},
url = {https://doi.org/10.1109/TR.2025.3623110},
researchr = {https://researchr.org/publication/DongGLY25},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {74},
number = {4},
pages = {4832-4841},
}